86 lines
1.9 KiB
Plaintext
86 lines
1.9 KiB
Plaintext
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NIST/ITL StRD
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Dataset Name: SiRstv (SiRstv.dat)
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File Format: ASCII
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Certified Values (lines 41 to 47)
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Data (lines 61 to 85)
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Procedure: Analysis of Variance
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Reference: Ehrstein, James and Croarkin, M. Carroll.
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Unpublished NIST dataset.
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Data: 1 Factor
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5 Treatments
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5 Replicates/Cell
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25 Observations
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3 Constant Leading Digits
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Lower Level of Difficulty
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Observed Data
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Model: 6 Parameters (mu,tau_1, ... , tau_5)
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y_{ij} = mu + tau_i + epsilon_{ij}
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Certified Values:
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Source of Sums of Mean
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Variation df Squares Squares F Statistic
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Between Instrument 4 5.11462616000000E-02 1.27865654000000E-02 1.18046237440255E+00
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Within Instrument 20 2.16636560000000E-01 1.08318280000000E-02
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Certified R-Squared 1.90999039051129E-01
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Certified Residual
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Standard Deviation 1.04076068334656E-01
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Data: Instrument Resistance
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1 196.3052
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1 196.1240
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1 196.1890
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1 196.2569
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1 196.3403
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2 196.3042
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2 196.3825
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2 196.1669
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2 196.3257
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2 196.0422
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3 196.1303
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3 196.2005
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3 196.2889
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3 196.0343
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3 196.1811
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4 196.2795
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4 196.1748
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4 196.1494
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4 196.1485
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4 195.9885
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5 196.2119
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5 196.1051
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5 196.1850
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5 196.0052
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5 196.2090
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