Inzynierka/Lib/site-packages/scipy/stats/tests/data/nist_anova/SiRstv.dat
2023-06-02 12:51:02 +02:00

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NIST/ITL StRD
Dataset Name: SiRstv (SiRstv.dat)
File Format: ASCII
Certified Values (lines 41 to 47)
Data (lines 61 to 85)
Procedure: Analysis of Variance
Reference: Ehrstein, James and Croarkin, M. Carroll.
Unpublished NIST dataset.
Data: 1 Factor
5 Treatments
5 Replicates/Cell
25 Observations
3 Constant Leading Digits
Lower Level of Difficulty
Observed Data
Model: 6 Parameters (mu,tau_1, ... , tau_5)
y_{ij} = mu + tau_i + epsilon_{ij}
Certified Values:
Source of Sums of Mean
Variation df Squares Squares F Statistic
Between Instrument 4 5.11462616000000E-02 1.27865654000000E-02 1.18046237440255E+00
Within Instrument 20 2.16636560000000E-01 1.08318280000000E-02
Certified R-Squared 1.90999039051129E-01
Certified Residual
Standard Deviation 1.04076068334656E-01
Data: Instrument Resistance
1 196.3052
1 196.1240
1 196.1890
1 196.2569
1 196.3403
2 196.3042
2 196.3825
2 196.1669
2 196.3257
2 196.0422
3 196.1303
3 196.2005
3 196.2889
3 196.0343
3 196.1811
4 196.2795
4 196.1748
4 196.1494
4 196.1485
4 195.9885
5 196.2119
5 196.1051
5 196.1850
5 196.0052
5 196.2090